The Florida Center for Analytical Electron Microscopy is located at Florida International University (FIU), University Park. It supports education and research in micro-analysis and imaging of materials and is a National Science Foundation (NSF) funded center.

The Center uses two instruments, the Electron Probe MicroAnalyzer (EPMA) JXA-8900-R and the JSM-5900-LV, low vacuum Scanning Electron Microscope (SEM). Both instruments are fully automated and remotely accessible. They are used in education, research and commercial applications.